Spatially Resolved Characterization
DuraMAT's existing spatially resolved characterization techniques include chemical composition (XRF), crystallographic structure (XRD), microstructure (AFM), surface properties (PES, KP), electrical transport (4-point probe), and optical properties (transmittance/reflectance, ellipsometry). All of them function as a position on a photovoltaic (PV) thin film.
The data analysis tools include:
- Custom-written processing and visualization routines for user-assisted data processing
- Data warehouse connections for data harvesting
- Project-specific databases for data analysis and visualization, such as the High-Throughput Experimental Materials Database.
We also offer combinatorial thin-film deposition capabilities. For more information, see High-Throughput Experimental Approach Capabilities.
National Renewable Energy Laboratory (NREL)
We extend our high-throughput experimental, combinatorial capabilities to handle insulators—e.g. multifunctional coatings for anti-soiling, antireflection, etc.—and potentially metals, e.g. electrical connections such as solder bonds.
These resources are available to NREL scientists and external collaborators.
Rajbhandar, P.P.; Bikowski, A.; Perkins, J.D.; Dhakal, T.P.; Zakutayev, A. (2017). “Combinatorial sputtering of Ga-doped (Zn,Mg)O for contact applications in solar cells.” Solar Energy Materials and Solar Cells. 159, 219-226.
Zakutayev, A.; Wunder, N.; Schwarting, M.; Perkins, J.D.; White, R.; Munch, K.; Tumas, W.; Phillips, C. (2018). “An open experimental database for exploring inorganic materials.”
Scientific Data. 5: 180053.
To learn more about this capability, contact Andriy Zakutauyev.