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Low-Cost Advanced Metallization to Reduce Cell-Crack-Induced Degradation for Increased Module Reliability

DuraMAT is focusing on materials qualification of low-cost, screen-printable, composite metallization and demonstration of its photovoltaic (PV) cell-crack-tolerance over the conventional silver paste metallization. We're also developing a predictive degradation modeling to estimate the lifetime of both composite-enhanced and conventional modules.

Osazda Energy is currently developing and validating advanced metallization technologies to improve long-term reliability of solar cells and PV modules for terrestrial, space, and unmanned aerial vehicle (UAV) applications. Its efforts have resulted in new processes that utilize our patented technologies to make solar cell manufacturing less costly and more robust than those made today.

Core Objective

Module Material Solutions

Location

Osazda Energy, University of New Mexico, Georgia Institute of Technology, and National Renewable Energy Laboratory

Applications

Osazda’s advanced metallization technologies are aimed at increasing the durability and lifetime of silicon PV modules, multijunction solar cells, light-weight mobile solar power units, and flexible electronics.

Availability

The crack-tolerant metallization technologies are available to silver paste manufacturing companies, silicon PV module manufacturers, space power system manufacturers, commercial UAV manufacturers, and flexible electronics developers.

References

John Chavez, April Jeffries, and Sang M. Han, Rice Alliance Energy Tech Venture Forum (September 15 – 17, 2020).

Michael Woodhouse, Henry Hieslmair, Andrew Gabor, and Sang M. Han, "Characterization of the impacts of module degradation and failure rates on PV project economics,” DuraMAT Webinar (June 8, 2020).

Sang M Han, “Advanced Composite Metallization Using Multiwalled Carbon Nanotubes,” in Task 13 Report 4.5 Cell Interconnection and Metallization, International Energy Agency Photovoltaic Power Systems Programme (IEA PVPS, 2020).

S.M. Han, O.K. Abudayyeh, A. Chavez, and D.M. Wilt, “Low-Cost, Crack-Tolerant, Screen-Printable Metallization for Increased Module Reliability,” PCT/US2019/039850 Published International Patent Application WO 2020/009936 A1 (January 20, 2020).

V.D. Upadhyaya and N. Bosco, “Fatigue-Like Behavior of Silver Metallization Gridlines and Proposed Damage Mechanical Model,” IEEE PVSC-47 (June 14 – 18, 2020).

Chavez, B. Rummel, N. Dowdy, S.M. Han, B. White, N. Heckman, and B. Boyce, “Electromechanical Characterization of Crack-Tolerant, Carbon-Nanotube-Reinforced Composite Gridlines Using In Situ Strain Test Setup under Scanning Electron Microscope,” IEEE PVSC-47 (June 14 – 18, 2020).

(Invited) S.M. Han, “Materials Engineering Solutions to Solar Module Reliability and Passive Cooling: Durability and Conservation in Tandem,” Department of Materials Science and Engineering, University of Delaware (April 8, 2020).

Chavez, B. Rummel, S.M. Han, B. White, and B. Boyce, “Mechanistic Understanding of Strain-Induced Failure of Carbon-Nanotube-Silver Metal Matrix Composite Gridlines Used in Solar Cells,” J. Mater. Sci. in preparation (2020).

O.K. Abudayyeh, A. Chavez, and S.M. Han, “Crack-Tolerant, Plug-and-Produce Silver-Carbon-Nanotube Paste for Si Solar Cells,” IEEE J. Photovolt. in preparation (2020).

(Invited) S.M. Han, “Cell Metallization Innovations,” EU PVSEC 2019 Task 13 Workshop, Marseille, France (September 9-13, 2019).

O.K. Abudayyeh, A. Chavez, J. Chavez, S.M. Han, B. Rounsaville, V. Upadhyaya, A. Rohatgi, B. McDanold, T. Silverman, N. Bosco, B. White, and B. Boyce, “Low-Cost Advanced Metallization to Reduce Cell-Crack-Induced Degradation for Increased Module Reliability,” DuraMAT 2019 Fall Workshop, Avon, CO (August 27 - 29, 2019).

O.K. Abudayyeh, A. Chavez, J. Chavez, S.M. Han, F. Zimbardi, B. Rounsaville, V. Upadhyaya, A. Rohatgi, B. McDanold, and T. Silverman, “Development of Low-Cost, Crack-Tolerant Metallization for Solar Cells,” IEEE PVSC 46 Chicago, IL (June 20, 2019).

O.K. Abudayyeh, A. Chavez, J. Chavez, S. M. Han, B. Rounsaville, V. Upadhyaya, A. Rohatgi, B. McDanold, T. Silverman, and N. Bosco, “Low-Cost Advanced Metallization to Reduce Cell-Crack-Induced Degradation for Increased Module Reliability,” NREL Reliability Workshop, Lakewood, CO (February 26-28, 2019). 

Contact

To learn more about this project, contact Sang Han.

Illustration of a cracked si solar cell and an embedded CNT within a severed gridline, and a photographic image of CNT within Silver

(a) Conceptual diagram of electrical bridging of metal gridline cracks by carbon nanotubes and (b) experimental observation.